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Ambient AFM / MFM 原子力顯微鏡
上海伯東代理英國 NanoMagnetics AFM - 原子力顯微鏡, 高精度和高分辨率使其可以分析許多不同樣品, AFM - 原子力顯微鏡可以在液體或空氣中測量. 手動校準, 采用白光 LED, 亮度可調(diào), 視野更佳. Z 噪音降至25 fm/√Hz.

Ambient AFM / MFM 原子力顯微鏡系統(tǒng)參數(shù)
標準掃描模式
• Intermittent Contact / Phase Contrast
• Contact
• Non-contact
• Lateral Force
• MFM
• EFM
(Any single mode standard, additional modes may be
added as options.)
可選掃描模式
• Scanning Tunneling Microscope (STM)
• Piezo Response Force Microscope (PrFM)
• Kelvin Probe Force Microscope (KPFM)
• Scanning Spreading Resistance Microscope (SSRM)
• Conductive AFM
• Capacitance Force Microscopy (CFM)
• Force Modulation Microscopy (FMM)
• AFM Spectroscopies
• Nanoindentation
• Nanolitography
Maximum Z Resolution
• <0.03nm with 100μmx100μm scanner
• <0.01nm with 40μmx40μm scanner
• <0.005nm with 4μmx4μm scanner
Static/Dynamic RMS Cantilever Z Noise
• <25fm √Hz noise floor with laser RF modulation
Scan Range
• 4x4x2 μm or 40x40x4 μm or 100x100x8 μm
STM Current Range
• 1pA-10nA, < 10fA / √Hz noise floor
Maximum Sample Size/Height
• 30x30x10 mm
Approach
• Software controlled
• Motorized
• <50 mm range with <250 nm sensivity
Camera
• CCD analog colour camera
Camera Resolution
• < 2 μm
Light Source for Optical Microscope
• White LED, adjustable from software
Signal Processing
• 16 bit ADCs / 24 bit DACs
• Digital feedback with FPGA / DSP
• Simultaneous scan of 16 channels
up to 4096x4096 pixels
Cantilevers
• All of the commercial cantilevers can be used
Acoustic ａnd Vibration Isolation
• Multilayer acoustic enclosure 180°access
0.3Hz passive vibration isolation table

     Polyethyleneimine            Phosphorylcolamine Topography  Phosphorylcolamine Phase Contrast    Polyvinyl Acetate