產(chǎn)品展示
優(yōu)質(zhì)供應(yīng)
詳細(xì)內(nèi)容
SFQ 數(shù)字電視測試發(fā)射機(jī)
TV Test Transmitter R&S SFQ is a complete solution for testing digital TV links and receivers. The open-end software and modular hardware make the R&S SFQ future-proof. The standards for DVB-T, DVB-S/DVB-DSNG, turbocoding, DVB-C, J.83B and ATSC/8VSB are fully complied with. Thanks to its adaptability to future system changes, R&S SFQ is a useful and rewarding investment for your launch onto the digital TV market.Moreover, R&S SFQ also processes analog frequency-modulated satellite signals in line with PAL, SECAM, NTSC standards. The sound signals are transmitted using analog FM and digital ADR sound subcarriers.The test signals produced are of high precision and comply with the standards, but they can also be varied and provided with predefined errors to determine the performance of your products at their limits. The reproducible simulation of real transmission conditions by means of the noise generator and the fading simulator enables the specification of modules under test.
|
| Characteristics
TV Test Transmitter R&S SFQ is a complete solution for testing digital TV links and receivers. The open-end software and modular hardware make the R&S SFQ future-proof. The standards for DVB-T, DVB-S/DVB-DSNG, turbocoding, DVB-C, J.83B and ATSC/8VSB are fully complied with. Thanks to its adaptability to future system changes, R&S SFQ is a useful and rewarding investment for your launch onto the digital TV market.Moreover, R&S SFQ also processes analog frequency-modulated satellite signals in line with PAL, SECAM, NTSC standards. The sound signals are transmitted using analog FM and digital ADR sound subcarriers.The test signals produced are of high precision and comply with the standards, but they can also be varied and provided with predefined errors to determine the performance of your products at their limits. The reproducible simulation of real transmission conditions by means of the noise generator and the fading simulator enables the specification of modules under test.
| ||||||||||||||||||||||||||||||||||||||
